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M/A-COM Reliability Tech Briefs

• Accelerated Lifetests for High-Speed 0.5-µm InGaAs PHEMT Switches
• Insight Into Using the Electronicmigration Black Equation for MTTF Estimates
• The Utilization of Focused Ion Beam (FIB) and Field Emission Electron Microscopy (FE-SEM) in Failure
• Reliability in Today's Business Environment
• Sidegating Effect in Ion-Implanted GaAs Self-Aligned Gate MESFET MMICs
• Solving Customer Problems Through Science
• Stage-Gating Accelerated Reliability Growth in an Industrial Environment
• Surface Mount Using Solderless Construction
• Transistor Aging Models of Key Parameters Due to Leakage Degraduation